â °æ ±â
¿¬
CHANG-KYUNG
ENTERPRISE CORP.
SEOCHO
P.O.BOX 77, SEOUL, KOREA TEL:(02)578-4796 FAX:(02)3463-3296

â°æ±â¿¬ ȨÆäÀÌÁö¸¦ ¹æ¹®ÇÏ¿©
Áּż °¨»çÇÕ´Ï´Ù.
Æó»ç´Â °úÇнÃÇè±â±â¸¦ Àü¹®À¸·Î Ãë±ÞÇÏ´Â ¹«¿ª¾÷ü·Î¼ Áö³ 20³â°£ ±¹³»ÀÇ °ü·Ã¾÷°è¿¡ ¸¹Àº ±â±â¸¦ °ø±Þ/¼ºñ½ºÇÏ¿© »ç¶ûÀ» ¹Þ¾Æ¿ÔÀ¾´Ï´Ù. ¾ÕÀ¸·Îµµ °è¼ÓÇÏ¿© ±¹³»ÀÇ ¿¬±¸°³¹ßºÐ¾ß¿¡ ´Ù¼Ò³ª¸¶ µµ¿òÀÌ µÉ ¼ö ÀÖµµ·Ï °è¼ÓÇÏ¿© ÃÖ¼±ÀÇ ³ë·ÂÀ» ´Ù ÇϰÚÀ¾´Ï´Ù.
±×¸²À̳ª ±â±â¸íÀ»
Ŭ¸¯ÇÏ¿© ÁÖ½Ã¸é º¸´Ù ÀÚ¼¼ÇÑ ³»¿ëÀ» º¸½Ç ¼ö
ÀÖÀ¾´Ï´Ù.
Ãë±Þǰ¸ñ
| °è¸é°úÇÐ ½ÃÇè±â±â (SURFACE & INTERFACIAL SCIENCE INSTRUMENTS) |
|
![]() |
Ç¥¸éÀå·Â ÃøÁ¤±â(SURFACE
TENSION METER) °è¸é°úÇбâ±âÀÇ Àü¹®¸ÞÀÌÄ¿ÀÎ ÀϺ»ÀÇ FACE SURFACE TENSION METER¿Í KSV SIGMA70 SERIES¸¦ ¼Ò°³ÇÕ´Ï´Ù. ¿ëµµ¿¡µû¶ó ¹ÝÀÚµ¿Çü¿¡¼ºÎÅÍ ¿ÏÀüÄÄÇ»ÅÍÈµÈ Á¦Ç°±îÁö ´Ù¾çÇÏ°Ô ¼±ÅÃÇÒ ¼ö ÀÖÀ¾´Ï´Ù. |
![]() |
Á¢Ã˰¢ ÃøÁ¤±â(CONTACT
ANGLE METR/ GONIO METER) Áö³ 65³â°£ °è¸é°úÇбâ±â¸¸À» Àü¹®À¸·Î Á¦ÀÛÇÏ¿© ¿Â ÀϺ»FACEÁ¦Ç°°ú FINLANDÀÇ KSVÁ¦Ç°ÀÇ ¿ì¼öÇÑ ¼º´ÉÀ» È®ÀÎÇÒ ¼öÀÖÀ»°ÍÀÔ´Ï´Ù. ¼öµ¿ÇüÀ¸·ÎºÎÅÍ ¿ÏÀüÀÚµ¿Çü±îÁö ´Ù¾çÇÏ°Ô °®Ãß¾îÁ® »ç¿ëÀÚÀÇ ¾î¶°ÇÑ ¿ëµµ¿¡µµ ÀÚ½ÅÀÖ°Ô ÃßõÇÏ¿© µå¸± ¼öÀÖÀ¾´Ï´Ù. ¾×ü¿Í°íü°£Àǰè¸éÈÇÐÀ»ÃøÁ¤ºÐ¼®Çϴµ¥ÇʼöÀûÀÎÀåºñÀÔ´Ï´Ù |
|
|
|
| ¡¡ | ¡¡ |
| ±â´É¼º °íºÐÀÚ ¹Ú¸· ¿¬±¸Àåºñ (LB FILM APPARATUS) |
|
![]() |
LB TROUGHS
(LB ¹Ú¸·Á¦ÀÛ ÀåÄ¡) LB-films and their exciting applications are in the focus of many different fields of today's scientific research. The applications range from, the study of kinetic reactions in biological membranes to molecular electronics and optical data storage. To meet the needs of such a wide variety of applications one must be able to offer a complete range of Langmuir troughs, accessories and customized systems. KSV supplies the widest selection of precision Langmuir instruments for today's Langmuir film researchers. |
![]() |
BREWSTER ANGLE MICROSCOPE(BAM)/À¯±â¹Ú¸·
°üÃøÀåÄ¡ BAM300 MiniBAM BAM
? Brewster Angle Microscopy, is a special technique for investigation
of organic thin films namely Langmuirfilms. |
![]() |
Polarisation Modulated Infrared
Reflection Absorption Spectroscopy FT-IRRAS¸¦ LB FILM SYSTEM¿¡ INTEGRATED. |
¡¡![]() |
¡¡KSV DIP COATER DIP COATER self assembly¿¡¼ÀÇ Çü¼ºµÈ ¹Ú¸·À» dipping ¹æ¹ý¿¡ ÀÇÇÏ¿© ÃÖÀûÈµÈ Á¶°ÇÇÏ¿¡¼ ±âÆÇ¿¡ ÄÚÆÃÇÒ ¼öÀÖµµ·Ï µðÀÚÀÎ µÈ Àåºñ·Î self assembly, layer-by-layer, sol-gel coatingÀ» ÇÒ ¼öÀÖÀ¾´Ï´Ù.
|
¡¡![]() |
Interfacial Shear Rheometer
¡¡ ISR 400 |
| NANO TECHNOLOGIES(Ç¥¸éºÐ¼®) | |
![]() |
Surface Plasmon Resonance ³ª³ë½ºÄÉÀÏ ±¸Á¶ÀÇ ±¤ÇÐÀû »ó¼ö¿Í µÎ²²¿¡ ´ëÇÑ °í°¨µµÀÇ SPR characterization KSV SPR200Àº SURFACE PLASMON RESONANCE ±â¼ú¿¡ ÀÖ¾î¼ »õ·Î¿î ¼¼´ë±³Ã¼·Î Ç¥¸é°úÇÐÀ» ³Ñ¾î¼´Â °í¼º´ÉÀÇ ±â´É°ú À¯¿¬ÇÏ°Ô ´Ù¾çÇÑ ¹üÀ§ÀÇ ¿¬±¸°³¹ß¿¡ ´ëüÇÏ°Ô ÇÕ´Ï´Ù |
¡¡![]() |
¡¡SCANNING
PROBE MICROSCOPE(SPM) ÁÖ»çŽħÇö¹Ì°æ À¯·´ÀÇ÷´Ü°úÇбâ±âȸ»çÀÎDME(Danish
Micro Engineering A/S)¿¡¼Scanning Probe Technology(SPT)ºÐ¾ßÀÇ ¿¬±¸¼Ò¿¡¼ °è¼ÓÀûÀÎ ¿¬±¸°³¹ß¿¡
ÀÇÇÏ¿©Á¦ÀÛµÈÁ¦Ç°À¸·Îmodular multiple modeÀÇ SPMÀ¸·Î¼ STM, Ultra-High Vacuum STM, electrochemical
STM, variable low temperature STM, contact & non-contact AFM, Scanning
Nearfield Optical Microscope(SNOM) µî SPMÀ¸·Î¼ ÇÊ¿äÇÑ ¸ðµç ´Ù¾çÇÑ ±â´ÉÀ» Áö¿øÇÕ´Ï´Ù.
|
| ¡¡ | .
|
| QCM IMPEDANCE ANALYSER |
|
|
KSV INSTRUMENTS LTD.¿¡¼ »õ·Ó°Ô °³¹ßÇÑ QCMÀ¸·Î¼ Ç¥¸éÈÇÐ, Àü±âÈÇÐ, ¹ÙÀÌ¿ÀÅ×Å©³î·¯Áö, LB¹Ú¸·¿¬±¸ µî°ú °°Àº ¹Ì¼¼ÇÑ Áú·®º¯È¿¡ µû¸¥ Ư¼ºº¯È ÃøÁ¤¿¡ À¯¿ëÇÏ°Ô »ç¿ëÇÒ ¼ö ÀÖ´Â Á¦Ç°ÀÔ´Ï´Ù. The new product line is a Quartz Crystal Microbalance for surface chemistry, polymer and biotechnology research. The QCM is based on the principle of Impedance analysis, which enables the determination of frequency changes (mass) and changes in the dissipation coefficient (viscoelastic properties) of adsorbed or deposited layers on a quartz crystal. |
|
|
|
|
| Ç¥¸é ¸¶Âû°è¼ö ÃøÁ¤ÀåÄ¡ | |
![]() |
MOBILE FRICTION METER (Æ÷ÅͺíÇü Ç¥¸é¸¶Âû°è¼ö ÃøÁ¤±â) ÄÞÆÑÆ® ŸÀÔÀÇ ±â±â·Î¼ »ùÇÃÀÌ ¹Ì²ô·¯Áü°ú µ¿½Ã¿¡ °¢µµ¸¦ ÃøÁ¤ÇÏ¿© coeffecient of static frictionÀ» ÃøÁ¤ÇÒ ¼ö ÀÖ½À´Ï´Ù. ÃøÁ¤¹öưÀ» ´Ü Çѹø ´·¯ÁÜÀ¸·Î½á ¿ÏÀü ÀÚµ¿À¸·Î ÃøÁ¤ÀÌ ÀÌ·ç¾îÁý´Ï´Ù. ¹öưÀ» ´·¯ÁÜÀ¸·Î½á ÃøÁ¤À» ½ÃÀÛÇϰí ÃøÁ¤°á°ú¸¦ ÀÚµ¿À¸·Î °è»êÇÏ¿© ¼öÃÊ À̳»¿¡ LED·Î Ç¥½ÃÇÏ¿© ÁÝ´Ï´Ù. |
![]() |
ÀÚµ¿¸¶Âû¸¶¸ðÇØ¼® ÀåÄ¡ ÄÄÇ»ÅÍ¿¡ ÀÇÇÑ ¸¶Âû¸¶¸ð°è¼ö ÃøÁ¤ ¹× ÇØ¼® ½Ã½ºÅÛÀ¸·Î ´Ù¾çÇÑ ¹æ¹ý¿¡ ÀÇÇÑ ÃøÁ¤,ÇØ¼®ÀÌ °¡´ÉÇÕ´Ï´Ù. |
| ¡¡ | |
| Sine Wave Áøµ¿ Á¡µµ°è | |
![]() |
Sine
Wave Vibro Viscometer SV-10/SV-100 Tuning-Fork vibration method¿¡ ÀÇÇÑ ÃֽŠ°í¼º´É Á¡µµ°è·Î¼ ¼¾¼ ±³Ã¼¾øÀÌ ´Ù¾çÇÑ ¹üÀ§ÀÇ ¾×ü Á¡µµ¸¦ ÃøÁ¤ÇÒ ¼ö ÀÖ´Ù. Sine-Wave vibro viscometer´Â
µÎ°³ÀÇ ¼¾¼¸¦ °ø¸í½ÃÄÑ ¹ß»ýÇÏ´Â Àü±âÀû ÀÛ¿ëÀ» ÃøÁ¤ÇÏ¿© Á¡µµ¸¦ ÃøÁ¤Çϵµ·Ï µÇ¾î ÀÖ½À´Ï´Ù. |
| ¡¡ | ¡¡ |
| ¡¡ | ¡¡ |
|
|
|
|
|
|
| Áøµ¿ ¹× °í¼Ó À̵¿¹°Ã¼ ¿¬±¸Àåºñ | |
![]() |
DIGITAL
HIGH SPEED IMAGING SYSTEM (µðÁöÅÐ °í¼Ó Ä«¸Þ¶ó ½Ã½ºÅÛ) a digital and PC controlled high speed imaging system. The images are converted to a digital format and stored to an electronic memory or to a hard disk of a PC. The system runs under Microsoft Windows software and the recordings are stored in standard Windows format. The real time image is seen on the PC screen and the recordings are available instantly for play back and processing. The images can be played backwards or forwards in slow motion or at various speeds, frame by frame or in a continuous non-stop loop. HiSIS features a strobe synch, an event synchronization, an external triggering, an electronic shutter control and full screen image area. |
![]() |
VIBRATION MONITOR (ȸÀüü Áøµ¿±³Á¤ ÀåÄ¡) ÀϺ» SIGMA ELECTRONICS CO.,LTD.ÀÇ ¹Ù¶õ½º °Ë»ç/±³Á¤ ¸ð´ÏÅͷμ ¿¬»è±â, ½ºÇɵé,¸ðŸ µî ȸÀüüÀÇ Áøµ¿ ¹× ȸÀü¼ö¸¦ ÀÚµ¿ÃøÁ¤ÇÏ¿© ±³Á¤Åä·Ï ÇÔÀ¸·Î½á ±â°èÀÇ Á¤¹Ðµµ¸¦ ³ôÀÌ°í ¼ö¸íÀ» ¿¬Àå½Ãų ¼ö ÀÖ´Â °íÁ¤µµÀÇ Á¤¹ÐÃøÁ¤/±³Á¤¿ë Á¦Ç°ÀÔ´Ï´Ù. |
| ¡¡ | ¡¡ |
â °æ ±â ¿¬
changkyung@changkyung.co.kr
¡¡